키자드에 등록된 om-tech의 네이버 블로그 포스트 목록

om-tech의 등록된 링크

om-tech로 등록된 네이버 블로그 포스트 수는 8건입니다.

ST1000 [내부링크]

Model: ST1000 - This system is designed for measuring thicknesses of Polymer on a Substrate Wafer. Specification Item Specification Measurable Wavelength range 400 ~ 800nm Detector (Linear Array Type) 2048 pixels Theoretical resolution 1.5 nm Measurement spot size About 2mm Measuring Speed ≤ 2sec/ point (Without Moving) Stage Size 250 x 250mm Thickness measurement range 500 Å ~ 35 (Depending on materials) Multi-layer measurement Up to 7 layers (Depends on materials) Repeatability (Precision) :

ST2000/2020 [내부링크]

[ST2000-DLXn] Model: ST2000/2020/Micro-gauge - This system is designed for measuring thicknesses of Polymer on a Substrate Wafer. Specification Item Specification Measurable Wavelength range 350 ~950nm Detector (Linear Array Type) 2048 pixels Theoretical resolution 1 nm Measurement spot size 5X: 40um, 10X: 20um, 50X: 4um(Option) Micor-gauge: About 2mm (Non-Focus Optics)) Measuring Speed ≤ 2sec/ point (Without Moving) Stage Size ST2000: 150 x 120mm, T/D: 75 x 50mm ST2020: 205 x 205mm, T/D: 205

ST4000/4030/AF-Option [내부링크]

[ST4000-DLX] Model: ST4000/4030/AF-Option - This system is designed for measuring thicknesses of Polymer on a Substrate Wafer. Specification Item Specification Measurable Wavelength range 350 ~950nm Detector (Linear Array Type) 2048 pixels Theoretical resolution 1 nm Measurement spot size 5X: 40um, 10X: 20um, 50X: 4um(Option) Glass Fiber Core: std 200um, 100um (Option) Measuring Speed ≤ 2sec/ point (Without Moving) Stage Size ST4000: 200 x 200mm, T/D: 200 x 200mm ST4030: 300 x 300mm, T/D: 300

ST5000 [내부링크]

[ST5000] Model: ST5000 - This system is designed for measuring thicknesses of Polymer on a Substrate Wafer. Specification Item Specification Measurable Wavelength range 350 ~950nm Detector (Linear Array Type) 2048 pixels Theoretical resolution 1 nm Measurement spot size 5X: 40um, 10X: 20um, 50X: 4um Glass Fiber Core: 200um, 100um (Option) Measuring Speed ≤ 2sec/ point (Without Moving) Stage Size ST4030: 300 x 300mm, T/D: 300 x 300mm Thickness measurement range 500 Å ~ 35 (Depending on material

ST5030 [내부링크]

[ST5030 SL on Passive Anti-vibration Table] Model: ST5030 - This system is designed for measuring thicknesses of Polymer on a Substrate Wafer. Specification Item Specification Measurable Wavelength range 350 ~950nm Detector (Linear Array Type) 2048 pixels Theoretical resolution 1 nm Measurement spot size 5X: 40um, 10X: 20um, 50X: 4um (Option) Glass Fiber Core: 200um, 100um (Option) Measuring Speed ≤ 2sec/ point (Without Moving) Stage Size 300 x 300mm, T/D: 300 x 300mm Thickness measurement ran

ST2080-OSP (OSP-Ray) [내부링크]

[ST2080-OSP] Model: ST2080-OSP - This system is designed for measuring Organic Solderability Preservative(OSP) Thickness on a Cu Substrate by fine measurement spot as 0.148. Specification Item Specification Measurable Wavelength range 420nm~640nm Detector 2 Dimensional CCD Camera Measurement spot size 1.48um(M5x Lens), 0.148um(M50x Lens) Sample Size Stage Size: 400 x 250 mm, St Thickness measurement range 350 Å ~ 3 (Depending on materials) > 0.15 ( OSP on Cu) ※ 0.1~0.15 Multi-layer measurement

ST4080-OSP [내부링크]

[ST4080-OSP] Model: ST4080-OSP - This system is designed for measuring Organic Solderability Preservative(OSP) Thickness on a Cu Substrate by fine measurement spot as 0.148. ST4080-OSP is no longer available. It is upgraded to ST2080-OSP of the same performance.

오엠텍(주) 방문을 환영합니다! [내부링크]

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